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T-2700 Compact Hardness Tester

The T-2700 Integrated Hardness Tester utilizes state-of-the-art microelectronic technology. This pocket-sized instrument incorporates a hardness impact probe, microprocessor, and OLED data display in a compact unit.

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Description

The T-2700 Integrated Hardness Tester is a pocket-sized device that uses advanced micro-electronic technology. It includes a hardness impact probe, microprocessor, and OLED data display in a compact unit. The T-2700 unit can conduct hardness measurements in the Rockwell C scale only.

Typical applications include on-site testing of large or heavy components, or items already installed as parts of a machine, as well as quality-control testing in the manufacturing process, especially of mass-produced components in the stockroom for material identification.

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Please note: quantities and descriptions are for reference only. Please refer to our 2024 Product Catalog for exact quantities and sizes.